"Cache-resident self-testing for I/O circuitry."

Sankar Gurumurthy et al. (2009)

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DOI: 10.1109/TEST.2009.5355549

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Sankar Gurumurthy, D. Bertanzetti, P. Jakobsen, Jeff Rearick:
Cache-resident self-testing for I/O circuitry. ITC 2009: 1-8

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