"Design for Testability of a Modular, Mixed Signal Family of VLSI Devices."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Ed Flaherty, Andrew Allen, John Morris (1993)

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DOI: 10.1109/TEST.1993.470622

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ed Flaherty, Andrew Allen, John Morris:
Design for Testability of a Modular, Mixed Signal Family of VLSI Devices. ITC 1993: 797-804

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