"Faults Which Challenge the In-Circuit Tester: Some Examples and Some ..."

Matthew L. Fichtenbaum (1982)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2002-10-23

- no documents available
- export record
  dblp key:
  - conf/itc/Fichtenbaum82
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/Fichtenbaum82
Matthew L. Fichtenbaum:
Faults Which Challenge the In-Circuit Tester: Some Examples and Some Solutions. ITC 1982: 530-536

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.