"Automated Design for Testability of Semicustom Integrated Circuits."

Patrick P. Fasang et al. (1985)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-11-11

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  - https://dblp.org/rec/conf/itc/FasangSSG85
Patrick P. Fasang, Michael A. Schuette, John Paul Shen, William A. Gwaltney:
Automated Design for Testability of Semicustom Integrated Circuits. ITC 1985: 558-564

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