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"On Reduction of Deterministic Test Pattern Sets."

Stephan Eggersglüß et al. (2021)

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DOI: 10.1109/ITC50571.2021.00035

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-29

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  dblp key:
  - conf/itc/EggersglussMRT21
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  - https://dblp.org/rec/conf/itc/EggersglussMRT21
Stephan Eggersglüß, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer:
On Reduction of Deterministic Test Pattern Sets. ITC 2021: 260-267

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