"System to Optimize Test Quality and Efficiency for Memories and LSI."

Robert G. Dunn et al. (1981)

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DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2002-10-22

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  dblp key:
  - conf/itc/DunnKRSS81
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  persistent URL:
  - https://dblp.org/rec/conf/itc/DunnKRSS81
Robert G. Dunn, A. Kwan, David P. Rodgers, D. Sandstrom, C. Sie:
System to Optimize Test Quality and Efficiency for Memories and LSI. ITC 1981: 31-37

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