"Automated test program generation for automotive devices."

Anke Drappa, Peter Huber, Jon Vollmar (2010)

> Home

Details and statistics

DOI: 10.1109/TEST.2010.5699253

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/itc/DrappaHV10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/DrappaHV10
Anke Drappa, Peter Huber, Jon Vollmar:
Automated test program generation for automotive devices. ITC 2010: 1-10

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.