"A BIST Methodology for Comprehensive Testing of RAM with Reduced Heat ..."

Hugo Cheung, Sandeep K. Gupta (1996)

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DOI: 10.1109/TEST.1996.557026

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Hugo Cheung, Sandeep K. Gupta:
A BIST Methodology for Comprehensive Testing of RAM with Reduced Heat Dissipation. ITC 1996: 386-395

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