"An Algorithm to Generate Tests for MOS Circuits at the Switch Level."

Harry H. Chen, Robert G. Mathews, John A. Newkirk (1985)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2006-06-27

- no documents available
- export record
  dblp key:
  - conf/itc/ChenMN85
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/ChenMN85
Harry H. Chen, Robert G. Mathews, John A. Newkirk:
An Algorithm to Generate Tests for MOS Circuits at the Switch Level. ITC 1985: 304-312

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.