"Instruction Based BIST for Board/System Level Test of External Memories ..."

Olivier Caty et al. (2003)

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DOI: 10.1109/TEST.2003.1271083

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-18

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Olivier Caty, Ismet Bayraktaroglu, Amitava Majumdar, Richard Lee, John Bell, Lisa Curhan:
Instruction Based BIST for Board/System Level Test of External Memories and Internconnects. ITC 2003: 961-970

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