"On Test Generation for Iddq Testing of Bridging Faults in CMOS Circuits."

S. Wayne Bollinger, Scott F. Midkiff (1991)

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DOI: 10.1109/TEST.1991.519723

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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S. Wayne Bollinger, Scott F. Midkiff:
On Test Generation for Iddq Testing of Bridging Faults in CMOS Circuits. ITC 1991: 598-607

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