"Affordable and Effective Screening of Delay Defects in ASICs using the ..."

Brady Benware et al. (2004)

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DOI: 10.1109/TEST.2004.1387403

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski:
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294

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