"Automatic Scan Insertion and Test Generation for Asynchronous Circuits."

Frank te Beest et al. (2002)

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DOI: 10.1109/TEST.2002.1041834

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Frank te Beest, Ad M. G. Peeters, Marc Verra, Kees van Berkel, Hans G. Kerkhoff:
Automatic Scan Insertion and Test Generation for Asynchronous Circuits. ITC 2002: 804-813

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