"VLSI Self-Testing Based on Syndrome Techniques."

Zeev Barzilai et al. (1981)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2002-10-22

- no documents available
- export record
  dblp key:
  - conf/itc/BarzilaiSMS81
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/BarzilaiSMS81
Zeev Barzilai, Jacob Savir, George Markowsky, Merlin G. Smith:
VLSI Self-Testing Based on Syndrome Techniques. ITC 1981: 102-109

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.