"Logic Device Characterization Using Computer-Aided Test and Analysis."

Robert W. Atherton, Leonard Ekkelkamp, Chuck Schmitz (1984)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-11-22

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Robert W. Atherton, Leonard Ekkelkamp, Chuck Schmitz:
Logic Device Characterization Using Computer-Aided Test and Analysis. ITC 1984: 367-383

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