"High Frequency Wafer Probing and Power Supply Resonance Effects."

S. P. Athan, David C. Keezer, J. McKinley (1991)

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DOI: 10.1109/TEST.1991.519776

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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S. P. Athan, David C. Keezer, J. McKinley:
High Frequency Wafer Probing and Power Supply Resonance Effects. ITC 1991: 1069-1078

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