"Known-good-die test methods for large, thin, high-power digital devices."

Dave Armstrong, Gary Maier (2016)

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DOI: 10.1109/TEST.2016.7805851

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Dave Armstrong, Gary Maier:
Known-good-die test methods for large, thin, high-power digital devices. ITC 2016: 1-6

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