"Lowering the cost of test with a scalable ATE custom processor and timing ..."

Brian Arkin (2005)

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DOI: 10.1109/TEST.2005.1584052

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Brian Arkin:
Lowering the cost of test with a scalable ATE custom processor and timing IC containing 400 high-linearity timing verniers. ITC 2005: 6

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