"Tester Correlation Problem in Memory Testers Used in Production Lines."

Masaaki Arao et al. (1983)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-11-05

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  dblp key:
  - conf/itc/AraoTMK83
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  persistent URL:
  - https://dblp.org/rec/conf/itc/AraoTMK83
Masaaki Arao, Takao Tadokoro, Hiromi Maruyama, Shinpei Kamata:
Tester Correlation Problem in Memory Testers Used in Production Lines. ITC 1983: 464-470

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