"A novel diagnostic test generation methodology and its application in ..."

M. Enamul Amyeen et al. (2016)

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DOI: 10.1109/TEST.2016.7805821

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  - https://dblp.org/rec/conf/itc/AmyeenKCNVJGS16
M. Enamul Amyeen, Dongok Kim, Maheshwar Chandrasekar, Mohammad Noman, Srikanth Venkataraman, Anurag Jain, Neha Goel, Ramesh Sharma:
A novel diagnostic test generation methodology and its application in production failure isolation. ITC 2016: 1-10

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