"Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs."

Bartomeu Alorda et al. (2002)

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DOI: 10.1109/TEST.2002.1041850

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura:
Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs. ITC 2002: 947-953

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