"Defect Oriented Testing of the Strap Problem Under Process Variations in ..."

Zaid Al-Ars et al. (2008)

> Home

Details and statistics

DOI: 10.1109/TEST.2008.4700631

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/itc/Al-ArsHGM08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/Al-ArsHGM08
Zaid Al-Ars, Said Hamdioui, Ad J. van de Goor, Georg Mueller:
Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs. ITC 2008: 1-10

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.