"Simulation based analysis of temperature effect on the faulty behavior of ..."

Zaid Al-Ars et al. (2001)

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DOI: 10.1109/TEST.2001.966700

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Zaid Al-Ars, Ad J. van de Goor, Jens Braun, Detlev Richter:
Simulation based analysis of temperature effect on the faulty behavior of embedded DRAMs. ITC 2001: 783-792

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