"Optimized Circuit Failure Prediction for Aging: Practicality and Promise."

Mridul Agarwal et al. (2008)

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DOI: 10.1109/TEST.2008.4700619

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Mridul Agarwal, Varsha Balakrishnan, Anshuman Bhuyan, Kyunglok Kim, Bipul C. Paul, Wenping Wang, Bo Yang, Yu Cao, Subhasish Mitra:
Optimized Circuit Failure Prediction for Aging: Practicality and Promise. ITC 2008: 1-10

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