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ORCID"2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, ..."
Bill Eklow, R. D. (Shawn) Blanton (2011)
- Bill Eklow, R. D. (Shawn) Blanton:
2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. IEEE Computer Society 2011, ISBN 978-1-4577-0153-5 [contents]
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