"Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset ..."

Aibin Yan et al. (2023)

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DOI: 10.1109/ITC-ASIA58802.2023.10301170

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-15

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Aibin Yan, Jing Xiang, Zhengfeng Huang, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen:
Design of A Highly Reliable and Low-Power SRAM With Double-Node Upset Recovery for Safety-critical Applications. ITC-Asia 2023: 1-6

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