"SRBML: A Single-Event-Upset Recoverable and BTI-Mitigated Latch Design for ..."

Fan Xia et al. (2024)

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DOI: 10.1109/ITC-ASIA62534.2024.10661343

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-14

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Fan Xia, Jing Zhang, Jehad Ali, Chunjiong Zhang, Xiaoqing Wen, Aibin Yan:
SRBML: A Single-Event-Upset Recoverable and BTI-Mitigated Latch Design for Long-Term Reliability Enhancement. ITC-Asia 2024: 1-5

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