"Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing."

Yukiko Shibasaki et al. (2019)

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DOI: 10.1109/ITC-ASIA.2019.00015

access: closed

type: Conference or Workshop Paper

metadata version: 2020-02-06

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Yukiko Shibasaki, Koji Asami, Anna Kuwana, Kosuke Machida, Yuanyang Du, Akemi Hatta, Kazuyoshi Kubo, Haruo Kobayashi:
Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing. ITC-Asia 2019: 7-12

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