"High Efficiency and Low Overkill Testing for Probabilistic Circuits."

Ming-Ting Lee et al. (2020)

> Home

Details and statistics

DOI: 10.1109/ITC-ASIA51099.2020.00026

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc-asia/LeeWLHL20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc-asia/LeeWLHL20
Ming-Ting Lee, Chen-Hung Wu, Shi-Tang Liu, Cheng-Yun Hsieh, James Chien-Mo Li:
High Efficiency and Low Overkill Testing for Probabilistic Circuits. ITC-Asia 2020: 83-87

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.