"An Improvement of the No-Reference Test Scheme Based on False Edge ..."

Hideyuki Ichihara, Naruki Itoh, Tomoo Inoue (2022)

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DOI: 10.1109/ITCASIA55616.2022.00026

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-21

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Hideyuki Ichihara, Naruki Itoh, Tomoo Inoue:
An Improvement of the No-Reference Test Scheme Based on False Edge Detection for Image Processing Application. ITC-Asia 2022: 90-95

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