"Software-hardware-cooperated built-in self-test scheme for channel-based ..."

Tsung-Fu Hsieh et al. (2017)

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DOI: 10.1109/ITC-ASIA.2017.8097122

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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Tsung-Fu Hsieh, Jin-Fu Li, Kuan-Te Wu, Jenn-Shiang Lai, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou:
Software-hardware-cooperated built-in self-test scheme for channel-based DRAMs. ITC-Asia 2017: 107-111

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