"Generating Test Patterns for Chiplet Interconnects: Achieving Optimal ..."

Po-Yao Chuang, Francesco Lorenzelli, Erik Jan Marinissen (2023)

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DOI: 10.1109/ITC-ASIA58802.2023.10301169

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Po-Yao Chuang, Francesco Lorenzelli, Erik Jan Marinissen:
Generating Test Patterns for Chiplet Interconnects: Achieving Optimal Effectiveness and Efficiency. ITC-Asia 2023: 1-6

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