"A Static Test Compaction Method Based on GCN Assisted Fault Gate ..."

Zhiteng Chao et al. (2024)

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DOI: 10.1109/ITC-ASIA62534.2024.10661347

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-14

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Zhiteng Chao, Qinluan Dai, Jiale Li, Zizhen Liu, Wenxing Li, Hongqin Lyu, Jing Ye, Huawei Li, Xiaowei Li:
A Static Test Compaction Method Based on GCN Assisted Fault Gate Classification. ITC-Asia 2024: 1-6

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