"Improving the Functional Test Delay Fault Coverage: A Microprocessor Case ..."

Aymen Touati et al. (2016)

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DOI: 10.1109/ISVLSI.2016.42

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Aymen Touati, Alberto Bosio, Patrick Girard, Arnaud Virazel, Paolo Bernardi, Matteo Sonza Reorda:
Improving the Functional Test Delay Fault Coverage: A Microprocessor Case Study. ISVLSI 2016: 731-736

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