"Concurrent Pseudo-Exhaustive Testing of Combinational VLSI Circuits."

Bassam Shaer (2004)

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DOI: 10.1109/ISVLSI.2004.1339560

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Bassam Shaer:
Concurrent Pseudo-Exhaustive Testing of Combinational VLSI Circuits. ISVLSI 2004: 289-290

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