"PUF-Based Secure Test Wrapper for SoC Testing."

Sudeendra Kumar K et al. (2018)

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DOI: 10.1109/ISVLSI.2018.00127

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sudeendra Kumar K, Saurabh Seth, Sauvagya Ranjan Sahoo, Abhishek Mahapatra, Ayas Kanta Swain, Kamalakanta Mahapatra:
PUF-Based Secure Test Wrapper for SoC Testing. ISVLSI 2018: 672-677

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