"Joint Minimization of Power and Area in Scan Testing by Scan Cell Reordering."

Shalini Ghosh, Sugato Basu, Nur A. Touba (2003)

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DOI: 10.1109/ISVLSI.2003.1183485

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Shalini Ghosh, Sugato Basu, Nur A. Touba:
Joint Minimization of Power and Area in Scan Testing by Scan Cell Reordering. ISVLSI 2003: 246-249

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