"Low Area Adaptive Fail-Data Compression Methodology for Defect ..."

Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani (2007)

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DOI: 10.1109/ISVLSI.2007.63

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani:
Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis. ISVLSI 2007: 171-178

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