"Defect-based Testing for Safety-critical ML Components."

Amit Sahu, Carmen Cârlan (2024)

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DOI: 10.1109/ISSREW63542.2024.00088

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-10

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Amit Sahu, Carmen Cârlan:
Defect-based Testing for Safety-critical ML Components. ISSRE (Workshops) 2024: 255-262

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