"Bitline-capacitance-cancelation sensing scheme with 11ns read latency and ..."

Mihail Jefremow et al. (2012)

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DOI: 10.1109/ISSCC.2012.6177076

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Mihail Jefremow, Thomas Kern, Ulrich Backhausen, Christian Peters, Christoph Parzinger, Christoph Roll, Stephan Kassenetter, Stefanie Thierold, Doris Schmitt-Landsiedel:
Bitline-capacitance-cancelation sensing scheme with 11ns read latency and maximum read throughput of 2.9GB/s in 65nm embedded flash for automotive. ISSCC 2012: 428-430

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