"Capacitively coupled non-contact probing circuits for membrane-based ..."

Mutsuo Daito et al. (2010)

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DOI: 10.1109/ISSCC.2010.5434018

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Mutsuo Daito, Yoshiro Nakata, Satoshi Sasaki, Hiroyuki Gomyo, Hideki Kusamitsu, Yoshio Komoto, Kunihiko Iizuka, Katsuyuki Ikeuchi, Gil-Su Kim, Makoto Takamiya, Takayasu Sakurai:
Capacitively coupled non-contact probing circuits for membrane-based wafer-level simultaneous testing. ISSCC 2010: 144-145

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