"Ultra-thin Gate Oxide Reliability and Implications for Design (Tutorial ..."

John S. Suehle (2002)

> Home

Details and statistics

DOI: 10.1109/ISQED.2002.10014

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  - electronic edition @ ieeecomputersociety.org
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/isqed/Suehle02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isqed/Suehle02
John S. Suehle:
Ultra-thin Gate Oxide Reliability and Implications for Design (Tutorial Abstract). ISQED 2002: 9

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.