"Low power latch design in near sub-threshold region to improve reliability ..."

Sandeep Sriram, Haiqing Nan, Ken Choi (2011)

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DOI: 10.1109/ISQED.2011.5770791

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Sandeep Sriram, Haiqing Nan, Ken Choi:
Low power latch design in near sub-threshold region to improve reliability for soft error. ISQED 2011: 611-614

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