"Statistical Data Stability and Leakage Evaluation of FinFET SRAM Cells ..."

Zhiyu Liu, Sherif A. Tawfik, Volkan Kursun (2008)

> Home

Details and statistics

DOI: 10.1109/ISQED.2008.4479745

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/isqed/LiuTK08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isqed/LiuTK08
Zhiyu Liu, Sherif A. Tawfik, Volkan Kursun:
Statistical Data Stability and Leakage Evaluation of FinFET SRAM Cells with Dynamic Threshold Voltage Tuning under Process Parameter Fluctuations. ISQED 2008: 305-310

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.