"Defect-Oriented Fault Simulation and Test Generation in Digital Circuits."

Wieslaw Kuzmicz et al. (2001)

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DOI: 10.1109/ISQED.2001.915257

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Wieslaw Kuzmicz, Witold A. Pleskacz, Jaan Raik, Raimund Ubar:
Defect-Oriented Fault Simulation and Test Generation in Digital Circuits. ISQED 2001: 365-371

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