"Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor ..."

Benoit Dubois et al. (2007)

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DOI: 10.1109/ISQED.2007.37

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Benoit Dubois, Jean-Baptiste Kammerer, Luc Hébrard, Francis Braun:
Analytical Modeling of Hot-Carrier Induced Degradation of MOS Transistor for Analog Design for Reliability. ISQED 2007: 53-58

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