"A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large ..."

Nigel Drego, Anantha P. Chandrakasan, Duane S. Boning (2007)

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DOI: 10.1109/ISQED.2007.24

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Nigel Drego, Anantha P. Chandrakasan, Duane S. Boning:
A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays. ISQED 2007: 281-286

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