"Comparison of supply noise and substrate noise reduction in SiGe BiCMOS ..."

Wai Leng Cheong et al. (2009)

> Home

Details and statistics

DOI: 10.1109/ISQED.2009.4810279

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/isqed/CheongOPHLFM09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isqed/CheongOPHLFM09
Wai Leng Cheong, Brian E. Owens, Hui En Pham, Christopher Hanken, Jim Le, Terri S. Fiez, Kartikeya Mayaram:
Comparison of supply noise and substrate noise reduction in SiGe BiCMOS and FDSOI processes. ISQED 2009: 112-115

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.