"InVerS: An Incremental Verification System with Circuit Similarity Metrics ..."

Kai-Hui Chang et al. (2007)

Details and statistics

DOI: 10.1109/ISQED.2007.94

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics