"Machine Learning Approach to Characteristic Fluctuation of Bulk FinFETs ..."

Rajat Butola, Yiming Li, Sekhar Reddy Kola (2022)

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DOI: 10.1109/ISQED54688.2022.9806233

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Rajat Butola, Yiming Li, Sekhar Reddy Kola:
Machine Learning Approach to Characteristic Fluctuation of Bulk FinFETs Induced by Random Interface Traps. ISQED 2022: 1-6

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